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On the Statistical Characterization of Lightning-Induced Voltages

1
University of Naples Federico II, Via Claudio 21, 80125 Naples, Italy
2
University of Naples Parthenope, Centro Direzionale di Napoli, Is. C4, 80143 Naples, Italy
*
Author to whom correspondence should be addressed.
Appl. Sci. 2018, 8(4), 651; https://doi.org/10.3390/app8040651
Received: 22 March 2018 / Revised: 13 April 2018 / Accepted: 19 April 2018 / Published: 23 April 2018
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Abstract

Protection against lightning-induced voltages is a particularly critical issue, especially for smart grids, due to the presence of electronic-based equipment, as well as control and monitoring devices. Analysis of the severity of the induced voltages is then imperative; on the other hand, the random nature of the lightning phenomenon cannot be disregarded. In this paper, the severity of lightning-induced voltage is analyzed by means of a probabilistic approach which, starting from closed-form solutions, uses a Monte Carlo procedure. Parametric distributions that best fit the distributions of the induced voltages are investigated as well. The results show that the lognormal and the generalized extreme value distributions are the best candidates. View Full-Text
Keywords: lightning-induced voltage; Monte Carlo procedure; statistical analysis lightning-induced voltage; Monte Carlo procedure; statistical analysis
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).
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Andreotti, A.; Mottola, F.; Pierno, A.; Proto, D. On the Statistical Characterization of Lightning-Induced Voltages. Appl. Sci. 2018, 8, 651.

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