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Accurate Models for Evaluating the Direct Conducted and Radiated Emissions from Integrated Circuits

1
Department of Industrial Engineering, University of Salerno, Campus di Fisciano, 84084 Fisciano, Italy
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Department of Engineering, University della Campania L. Vanvitelli, Via Roma 29, 81031 Aversa, Italy
3
Department of Electrical and Information Engineering, University of Cassino and Southern Lazio, via G. Di Biasio 43, 03043 Cassino, Italy
*
Author to whom correspondence should be addressed.
Appl. Sci. 2018, 8(4), 477; https://doi.org/10.3390/app8040477
Received: 17 January 2018 / Revised: 1 March 2018 / Accepted: 20 March 2018 / Published: 21 March 2018
This paper deals with the electromagnetic compatibility (EMC) issues related to the direct and radiated emissions from a high-speed integrated circuits (ICs). These emissions are evaluated here by means of circuital and electromagnetic models. As for the conducted emission, an equivalent circuit model is derived to describe the IC and the effect of its loads (package, printed circuit board, decaps, etc.), based on the Integrated Circuit Emission Model template (ICEM). As for the radiated emission, an electromagnetic model is proposed, based on the superposition of the fields generated in the far field region by the loop currents flowing into the IC and the package pins. A custom experimental setup is designed for validating the models. Specifically, for the radiated emission measurement, a custom test board is designed and realized, able to highlight the contribution of the direct emission from the IC, usually hidden by the indirect emission coming from the printed circuit board. Measurements of the package currents and of the far-field emitted fields are carried out, providing a satisfactory agreement with the model predictions. View Full-Text
Keywords: electromagnetic compatibility; integrated circuits; EMI modeling; conducted emission; radiated emission electromagnetic compatibility; integrated circuits; EMI modeling; conducted emission; radiated emission
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MDPI and ACS Style

Capriglione, D.; Chiariello, A.G.; Maffucci, A. Accurate Models for Evaluating the Direct Conducted and Radiated Emissions from Integrated Circuits. Appl. Sci. 2018, 8, 477.

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