Order Article Reprints

Raja AY, Moghiseh M, Bateman CJ, De Ruiter N, Schon B, Schleich N, Woodfield TBF, Butler APH, Anderson NG. Measuring Identification and Quantification Errors in Spectral CT Material Decomposition. Applied Sciences. 2018; 8(3):467. https://doi.org/10.3390/app8030467

Raja, Aamir Younis, Mahdieh Moghiseh, Christopher J. Bateman, Niels De Ruiter, Benjamin Schon, Nanette Schleich, Tim B. F. Woodfield, Anthony P. H. Butler, and Nigel G. Anderson. 2018. "Measuring Identification and Quantification Errors in Spectral CT Material Decomposition" Applied Sciences 8, no. 3: 467. https://doi.org/10.3390/app8030467

Raja, A. Y., Moghiseh, M., Bateman, C. J., De Ruiter, N., Schon, B., Schleich, N., Woodfield, T. B. F., Butler, A. P. H., & Anderson, N. G. (2018). Measuring Identification and Quantification Errors in Spectral CT Material Decomposition. Applied Sciences, 8(3), 467. https://doi.org/10.3390/app8030467