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Appl. Sci. 2018, 8(1), 143;

Incoherent Digital Holography: A Review

Department of Photonics, Feng Chia University, 100 Wenhwa Rd., Seatwen, Taichung 40725, Taiwan
Faculty of Engineering Science, Kansai University, 3-3-35 Yamate-cho, Suita, Osaka 564-8680, Japan
PRESTO, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan
Center for Optical Research & Education (CORE), Utsunomiya University, 7-1-2 Yoto, Utsunomiya 321-8585, Japan
Bradley Department of Electrical and Computer Engineering, Virginia Tech, Blacksburg, VA 24061, USA
Author to whom correspondence should be addressed.
Received: 31 December 2017 / Revised: 12 January 2018 / Accepted: 16 January 2018 / Published: 20 January 2018
(This article belongs to the Special Issue Holography and 3D Imaging: Tomorrows Ultimate Experience)
Full-Text   |   PDF [4426 KB, uploaded 20 January 2018]   |  


Digital holography (DH) is a promising technique for modern three-dimensional (3D) imaging. Coherent holography records the complex amplitude of a 3D object holographically, giving speckle noise upon reconstruction and presenting a serious drawback inherent in coherent optical systems. On the other hand, incoherent holography records the intensity distribution of the object, allowing a higher signal-to-noise ratio as compared to its coherent counterpart. Currently there are two incoherent digital holographic techniques: optical scanning holography (OSH) and Fresnel incoherent correlation holography (FINCH). In this review, we first explain the principles of OSH and FINCH. We then compare, to some extent, the differences between OSH and FINCH. Finally, some of the recent applications of the two incoherent holographic techniques are reviewed. View Full-Text
Keywords: incoherent holography; digital holography; optical scanning holography; holographic microscope incoherent holography; digital holography; optical scanning holography; holographic microscope

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Liu, J.-P.; Tahara, T.; Hayasaki, Y.; Poon, T.-C. Incoherent Digital Holography: A Review. Appl. Sci. 2018, 8, 143.

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