Zero-Voltage Ride-Through Capability of Single-Phase Grid-Connected Photovoltaic Systems
AbstractDistributed renewable energy systems play an increasing role in today’s energy paradigm. Thus, intensive research activities have been centered on improving the performance of renewable energy systems, including photovoltaic (PV) systems, which should be of multiple-functionality. That is, the PV systems should be more intelligent in the consideration of grid stability, reliability, and fault protection. Therefore, in this paper, the performance of single-phase grid-connected PV systems under an extreme grid fault (i.e., when the grid voltage dips to zero) is explored. It has been revealed that combining a fast and accurate synchronization mechanism with appropriate control strategies for the zero-voltage ride-through (ZVRT) operation is mandatory. Accordingly, the representative synchronization techniques (i.e., the phase-locked loop (PLL) methods) in the ZVRT operation are compared in terms of detection precision and dynamic response. It shows that the second-order generalized integrator (SOGI-PLL) is a promising solution for single-phase systems in the case of fault ride-through. A control strategy by modifying the SOGI-PLL scheme is then introduced to single-phase grid-connected PV systems for ZVRT operation. Simulations are performed to verify the discussions. The results have demonstrated that the proposed method can help single-phase PV systems to temporarily ride through zero-voltage faults with good dynamics. View Full-Text
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Zhang, Z.; Yang, Y.; Ma, R.; Blaabjerg, F. Zero-Voltage Ride-Through Capability of Single-Phase Grid-Connected Photovoltaic Systems. Appl. Sci. 2017, 7, 315.
Zhang Z, Yang Y, Ma R, Blaabjerg F. Zero-Voltage Ride-Through Capability of Single-Phase Grid-Connected Photovoltaic Systems. Applied Sciences. 2017; 7(4):315.Chicago/Turabian Style
Zhang, Zhen; Yang, Yongheng; Ma, Ruiqing; Blaabjerg, Frede. 2017. "Zero-Voltage Ride-Through Capability of Single-Phase Grid-Connected Photovoltaic Systems." Appl. Sci. 7, no. 4: 315.
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