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Journal: Appl. Sci., 2025
Volume: 15
Number: 11991
11991
Article: A Framework-Driven Evaluation and Survey of MCU Fault Injection Resilience for IoT
Authors: by Igor Seniushin, Natalya Glazyrina, Yernat Atanbayev, Kamal Bairamov, Yenlik Satiyeva, Olzhas Nurman and Mamyr Altaibek
Link: https://www.mdpi.com/2076-3417/15/22/11991

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