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Journal: Appl. Sci., 2024
Volume: 14
Number: 3213

Article: A Concise State-of-the-Art Review of Crack Monitoring Enabled by RFID Technology
Authors: by Sheng-Cai Ran, Qi-Ang Wang, Jun-Fang Wang, Yi-Qing Ni, Zhong-Xu Guo and Yang Luo
Link: https://www.mdpi.com/2076-3417/14/8/3213

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