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Journal: Appl. Sci., 2024
Volume: 14
Number: 2785

Article: A Methodology for Advanced Manufacturing Defect Detection through Self-Supervised Learning on X-ray Images
Authors: by Eneko Intxausti, Danijel Skočaj, Carlos Cernuda and Ekhi Zugasti
Link: https://www.mdpi.com/2076-3417/14/7/2785

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