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Journal: Appl. Sci., 2024
Volume: 14
Number: 10348
Article:
Mitigating Pass Gate Effect in Buried Channel Array Transistors Through Buried Oxide Integration: Addressing Interference Phenomenon Between Word Lines
Authors:
by
Yeongmyeong Cho, Yeon-Seok Kim and Min-Woo Kwon
Link:
https://www.mdpi.com/2076-3417/14/22/10348
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