Terayama, Y.; Khajornrungruang, P.; Seo, J.; Hamada, S.; Wada, Y.; Hiyama, H.
Detachment Energy Evaluation in Nano-Particle Cleaning Using Lateral Force Microscopy. Appl. Sci. 2024, 14, 8145.
https://doi.org/10.3390/app14188145
AMA Style
Terayama Y, Khajornrungruang P, Seo J, Hamada S, Wada Y, Hiyama H.
Detachment Energy Evaluation in Nano-Particle Cleaning Using Lateral Force Microscopy. Applied Sciences. 2024; 14(18):8145.
https://doi.org/10.3390/app14188145
Chicago/Turabian Style
Terayama, Yutaka, Panart Khajornrungruang, Jihoon Seo, Satomi Hamada, Yutaka Wada, and Hirokuni Hiyama.
2024. "Detachment Energy Evaluation in Nano-Particle Cleaning Using Lateral Force Microscopy" Applied Sciences 14, no. 18: 8145.
https://doi.org/10.3390/app14188145
APA Style
Terayama, Y., Khajornrungruang, P., Seo, J., Hamada, S., Wada, Y., & Hiyama, H.
(2024). Detachment Energy Evaluation in Nano-Particle Cleaning Using Lateral Force Microscopy. Applied Sciences, 14(18), 8145.
https://doi.org/10.3390/app14188145