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Review
Peer-Review Record

Crystal-Based X-ray Interferometry and Its Application to Phase-Contrast X-ray Imaging, Zeff Imaging, and X-ray Thermography

Appl. Sci. 2023, 13(9), 5424; https://doi.org/10.3390/app13095424
by Akio Yoneyama 1,2,3,*, Daiko Takamatsu 4, Thet-Thet Lwin 5, Shigehito Yamada 6, Tetsuya Takakuwa 7, Kazuyuki Hyodo 3, Keiichi Hirano 3 and Satoshi Takeya 3,8
Reviewer 1: Anonymous
Reviewer 2:
Reviewer 3:
Appl. Sci. 2023, 13(9), 5424; https://doi.org/10.3390/app13095424
Submission received: 1 April 2023 / Revised: 23 April 2023 / Accepted: 24 April 2023 / Published: 26 April 2023

Round 1

Reviewer 1 Report

The article makes an interesting presentation of the current topic. The manuscript is well-structured. Each section is well detailed. The figures are clear and attractive. The quality of the English language is very good. I consider the references appropriate.

I recommend publishing the article.

Author Response

Thank you very much for your thoughtful review and comments. 

Reviewer 2 Report

The paper presents a thorough review on current crystal-based X-ray interferometry technology and its applications in various X-ray imaging modalities. The principle, instrumentation and applications are well described. The manuscript is in good form for publication.

Author Response

Thank you very much for your thoughtful review and comments. 

Reviewer 3 Report


Comments for author File: Comments.pdf


Author Response

Please see the attachment.

Author Response File: Author Response.docx

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