Competing Failure Modeling for Systems under Classified Random Shocks and Degradation
Abstract
:1. Introduction
- (1)
- The cumulative shock model: This model considers that every shock will cause damage, and as soon as the cumulative damage exceeds the threshold, the hard failure occurs.
- (2)
- The extreme shock model: Hard failure occurs when the size of any shock exceeds a specific threshold in this model.
- (3)
- The m-shock model: This model holds that failure occurs when the m-shock sizes are greater than a threshold.
- (4)
- The run shock model: Similar to the extreme model and the m-shock model, it fails when a run of shocks’ sizes exceeds the threshold.
- (5)
- The δ shock model: Time lag is selected as the index. Failure occurs when the time lag between two successive shocks is smaller than a threshold.
2. System Description and Notation
2.1. System Description
2.2. Notation
Overall degradation | |
Pure degradation | |
Degradation increment caused by external random shocks | |
Wi | Size of the ith random shock |
Ai Bj Ck | Three types of degradation increments, which are i.i.d. random variables |
rn | Rate of shock type n |
Poisson process n with rate | |
D0 | Failure threshold for hard risk mode |
D1 | Degradation increase threshold 1 |
D2 | Degradation increase threshold 2 |
Cumulative distribution function (CDF) of | |
G(x,t) | Cumulative distribution function (CDF) of |
Probability distribution function (PDF) of the sum of m i.i.d. Bj and n Ck | |
Cumulative distribution function (CDF) of Wi | |
RH | Survival probability for hard risk mode |
System reliability probability (abbreviated by SRP) | |
Competing failure probability (abbreviated by CFP) | |
Modified system reliability probability (abbreviated by MSRP) | |
Modified competing failure probability (abbreviated by MCFP) |
3. Modeling for Risk Modes
3.1. Modeling for Soft Failure
3.2. Modeling for Hard Failure
4. Reliability Assemble
4.1. System Reliability and Competing Failure Analysis
4.2. Deriving of the Modified Probability
5. Numerical Case: An MEMS Application
6. Conclusions and Summary
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
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Parameters | Values | Sources |
---|---|---|
H | 0.00125 | Tanner [27] |
D0 | 1.5 | Tanner [27] |
D1 | 1.2 | Assumption |
D2 | 1.0 | Assumption |
φ | 0 | Tanner [27] |
β | ~N (μβ, σβ2) μβ = 8.4823 × 10−9 μm3 σβ = 6.0016 × 10−10 μm3 | Tanner [2] |
Wi | ~N (μW, σW2) μW = 1.2 Gpa σW = 0.2 Gpa | Jiang L. [4] |
λ | 5 × 10 − 5/revolution | Jiang L. [4] |
Bi | ~N (μB, σB2) μB = 1.2 × 10−4 μm3 σB = 2 × 10−10 μm3 | Assumption |
Ci | ~N (μC, σC2) μC = 1.8×10−4 μm3 σC = 2×10−10 μm3 | Assumption |
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Liu, J.; Zhang, K.; Pang, H. Competing Failure Modeling for Systems under Classified Random Shocks and Degradation. Appl. Sci. 2023, 13, 7490. https://doi.org/10.3390/app13137490
Liu J, Zhang K, Pang H. Competing Failure Modeling for Systems under Classified Random Shocks and Degradation. Applied Sciences. 2023; 13(13):7490. https://doi.org/10.3390/app13137490
Chicago/Turabian StyleLiu, Jingyi, Kaichao Zhang, and Huan Pang. 2023. "Competing Failure Modeling for Systems under Classified Random Shocks and Degradation" Applied Sciences 13, no. 13: 7490. https://doi.org/10.3390/app13137490