Luo, Y.; Ding, X.; Chen, T.; Lin, G.; Su, T.; Chen, D.
Imaging the Permittivity of Thin Film Materials by Using Scanning Capacitance Microscopy. Appl. Sci. 2022, 12, 11979.
https://doi.org/10.3390/app122311979
AMA Style
Luo Y, Ding X, Chen T, Lin G, Su T, Chen D.
Imaging the Permittivity of Thin Film Materials by Using Scanning Capacitance Microscopy. Applied Sciences. 2022; 12(23):11979.
https://doi.org/10.3390/app122311979
Chicago/Turabian Style
Luo, Yongzhen, Xidong Ding, Tianci Chen, Guocong Lin, Tao Su, and Dihu Chen.
2022. "Imaging the Permittivity of Thin Film Materials by Using Scanning Capacitance Microscopy" Applied Sciences 12, no. 23: 11979.
https://doi.org/10.3390/app122311979
APA Style
Luo, Y., Ding, X., Chen, T., Lin, G., Su, T., & Chen, D.
(2022). Imaging the Permittivity of Thin Film Materials by Using Scanning Capacitance Microscopy. Applied Sciences, 12(23), 11979.
https://doi.org/10.3390/app122311979