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Journal: Appl. Sci., 2022
Volume: 12
Number: 8151
Article:
Comparative Study of Oxygen- and Carbon-Related Defects in Electron Irradiated Cz–Si Doped with Isovalent Impurities
Authors:
by
Charalampos A. Londos, Alexander Chroneos, Efstratia N. Sgourou, Ioannis Panagiotidis, Theoharis Angeletos and Marianna S. Potsidi
Link:
https://www.mdpi.com/2076-3417/12/16/8151
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