Article Versions Notes

Londos CA, Chroneos A, Sgourou EN, Panagiotidis I, Angeletos T, Potsidi MS. Comparative Study of Oxygen- and Carbon-Related Defects in Electron Irradiated Cz–Si Doped with Isovalent Impurities. Applied Sciences. 2022; 12(16):8151. https://doi.org/10.3390/app12168151

Londos, Charalampos A., Alexander Chroneos, Efstratia N. Sgourou, Ioannis Panagiotidis, Theoharis Angeletos, and Marianna S. Potsidi. 2022. "Comparative Study of Oxygen- and Carbon-Related Defects in Electron Irradiated Cz–Si Doped with Isovalent Impurities" Applied Sciences 12, no. 16: 8151. https://doi.org/10.3390/app12168151

Londos, C. A., Chroneos, A., Sgourou, E. N., Panagiotidis, I., Angeletos, T., & Potsidi, M. S. (2022). Comparative Study of Oxygen- and Carbon-Related Defects in Electron Irradiated Cz–Si Doped with Isovalent Impurities. Applied Sciences, 12(16), 8151. https://doi.org/10.3390/app12168151