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Journal: Appl. Sci., 2021
Volume: 11
Number: 10419

Article: Sequential and Comprehensive Algorithm for Fault Detection in Semiconductor Sensors
Authors: by Hirak Mazumdar, Tae Hyeon Kim, Jong Min Lee, Euiseok Kum, Seungho Lee, Suho Jeong and Bong Geun Chung
Link: https://www.mdpi.com/2076-3417/11/21/10419

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