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Journal: Appl. Sci., 2021
Volume: 11
Number: 551

Article: Defect Processes in Halogen Doped SnO2
Authors: by Petros-Panagis Filippatos, Nikolaos Kelaidis, Maria Vasilopoulou, Dimitris Davazoglou and Alexander Chroneos
Link: https://www.mdpi.com/2076-3417/11/2/551

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