Shanidze, L.V.; Tarasov, A.S.; Rautskiy, M.V.; Zelenov, F.V.; Konovalov, S.O.; Nemtsev, I.V.; Voloshin, A.S.; Tarasov, I.A.; Baron, F.A.; Volkov, N.V.
Cu-Doped TiNxOy Thin Film Resistors DC/RF Performance and Reliability. Appl. Sci. 2021, 11, 7498.
https://doi.org/10.3390/app11167498
AMA Style
Shanidze LV, Tarasov AS, Rautskiy MV, Zelenov FV, Konovalov SO, Nemtsev IV, Voloshin AS, Tarasov IA, Baron FA, Volkov NV.
Cu-Doped TiNxOy Thin Film Resistors DC/RF Performance and Reliability. Applied Sciences. 2021; 11(16):7498.
https://doi.org/10.3390/app11167498
Chicago/Turabian Style
Shanidze, Lev V., Anton S. Tarasov, Mikhail V. Rautskiy, Fyodor V. Zelenov, Stepan O. Konovalov, Ivan V. Nemtsev, Alexander S. Voloshin, Ivan A. Tarasov, Filipp A. Baron, and Nikita V. Volkov.
2021. "Cu-Doped TiNxOy Thin Film Resistors DC/RF Performance and Reliability" Applied Sciences 11, no. 16: 7498.
https://doi.org/10.3390/app11167498
APA Style
Shanidze, L. V., Tarasov, A. S., Rautskiy, M. V., Zelenov, F. V., Konovalov, S. O., Nemtsev, I. V., Voloshin, A. S., Tarasov, I. A., Baron, F. A., & Volkov, N. V.
(2021). Cu-Doped TiNxOy Thin Film Resistors DC/RF Performance and Reliability. Applied Sciences, 11(16), 7498.
https://doi.org/10.3390/app11167498
