Evolvement Investigation of Secondary Electron Emission for Ultrathin MgO Coatings Prepared by Atomic Layer Deposition
Abstract
:1. Introduction
2. Preparation and SEY Characterization Methods of MgO Coatings
2.1. Preparation of MgO Coatings by ALD
2.2. SEY Measurement of MgO Coatings
2.3. Energy Spectrum and Surface Analysis Methods
3. Results and Discussions
3.1. Surface Analysis of MgO/Si Double-Layer Structures
3.2. SEE Characteristics of MgO/Si Double-Layer Structures
3.3. Secondary Electron Energy Spectra Characterization
3.4. Theoretical Analyzation of SEE Processes in a Double-Layer Structure
3.5. Theoretical Explanation on the SEE Properties of MgO/Si Double-Layer Structures
4. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
References
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Parameter | MgO | Si | 1 nm | 3 nm | 7 nm | 12 nm | 20 nm | 30 nm |
---|---|---|---|---|---|---|---|---|
δm | 6.15 | 1.61 | 2.63 | 4.27 | 5.14 | 5.72 | 5.93 | 6.11 |
Epm/eV | 600 | 200 | 250 | 350 | 500 | 550 | 550 | 600 |
Material | A | B | λ/nm | Ea/eV |
---|---|---|---|---|
Si | 2400 | 0.023 | 0.2 | 1.12 |
MgO | 3500 | 0.225 | 1.3 | 9.00 |
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Zhu, X.; Guo, J.; Li, X.; Zhou, R.; Wang, D.; Zhao, W. Evolvement Investigation of Secondary Electron Emission for Ultrathin MgO Coatings Prepared by Atomic Layer Deposition. Appl. Sci. 2021, 11, 4801. https://doi.org/10.3390/app11114801
Zhu X, Guo J, Li X, Zhou R, Wang D, Zhao W. Evolvement Investigation of Secondary Electron Emission for Ultrathin MgO Coatings Prepared by Atomic Layer Deposition. Applied Sciences. 2021; 11(11):4801. https://doi.org/10.3390/app11114801
Chicago/Turabian StyleZhu, Xiangping, Junjiang Guo, Xiangxin Li, Rundong Zhou, Dan Wang, and Wei Zhao. 2021. "Evolvement Investigation of Secondary Electron Emission for Ultrathin MgO Coatings Prepared by Atomic Layer Deposition" Applied Sciences 11, no. 11: 4801. https://doi.org/10.3390/app11114801