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Journal: Appl. Sci., 2020
Volume: 10
Number: 1292
Article:
Simulation Research on Sparse Reconstruction for Defect Signals of Flip Chip Based on High-Frequency Ultrasound
Authors:
by
Xiaonan Yu, Hairun Huang, Wanlong Xie, Jiefei Gu, Ke Li and Lei Su
Link:
https://www.mdpi.com/2076-3417/10/4/1292
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