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Zirkle TA, Filmer MJ, Chisum J, Orlov AO, Dupont-Ferrier E, Rivard J, Huebner M, Sanquer M, Jehl X, Snider GL. Radio Frequency Reflectometry of Single-Electron Box Arrays for Nanoscale Voltage Sensing Applications. Applied Sciences. 2020; 10(24):8797. https://doi.org/10.3390/app10248797

Zirkle, Thomas A., Matthew J. Filmer, Jonathan Chisum, Alexei O. Orlov, Eva Dupont-Ferrier, Joffrey Rivard, Matthew Huebner, Marc Sanquer, Xavier Jehl, and Gregory L. Snider. 2020. "Radio Frequency Reflectometry of Single-Electron Box Arrays for Nanoscale Voltage Sensing Applications" Applied Sciences 10, no. 24: 8797. https://doi.org/10.3390/app10248797

Zirkle, T. A., Filmer, M. J., Chisum, J., Orlov, A. O., Dupont-Ferrier, E., Rivard, J., Huebner, M., Sanquer, M., Jehl, X., & Snider, G. L. (2020). Radio Frequency Reflectometry of Single-Electron Box Arrays for Nanoscale Voltage Sensing Applications. Applied Sciences, 10(24), 8797. https://doi.org/10.3390/app10248797