Engel, R.Y.; Miedema, P.S.; Turenne, D.; Vaskivskyi, I.; Brenner, G.; Dziarzhytski, S.; Kuhlmann, M.; Schunck, J.O.; Döring, F.; Styervoyedov, A.;
et al. Parallel Broadband Femtosecond Reflection Spectroscopy at a Soft X-Ray Free-Electron Laser. Appl. Sci. 2020, 10, 6947.
https://doi.org/10.3390/app10196947
AMA Style
Engel RY, Miedema PS, Turenne D, Vaskivskyi I, Brenner G, Dziarzhytski S, Kuhlmann M, Schunck JO, Döring F, Styervoyedov A,
et al. Parallel Broadband Femtosecond Reflection Spectroscopy at a Soft X-Ray Free-Electron Laser. Applied Sciences. 2020; 10(19):6947.
https://doi.org/10.3390/app10196947
Chicago/Turabian Style
Engel, Robin Y., Piter S. Miedema, Diego Turenne, Igor Vaskivskyi, Günter Brenner, Siarhei Dziarzhytski, Marion Kuhlmann, Jan O. Schunck, Florian Döring, Andriy Styervoyedov,
and et al. 2020. "Parallel Broadband Femtosecond Reflection Spectroscopy at a Soft X-Ray Free-Electron Laser" Applied Sciences 10, no. 19: 6947.
https://doi.org/10.3390/app10196947
APA Style
Engel, R. Y., Miedema, P. S., Turenne, D., Vaskivskyi, I., Brenner, G., Dziarzhytski, S., Kuhlmann, M., Schunck, J. O., Döring, F., Styervoyedov, A., Parkin, S. S. P., David, C., Schüßler-Langeheine, C., Dürr, H. A., & Beye, M.
(2020). Parallel Broadband Femtosecond Reflection Spectroscopy at a Soft X-Ray Free-Electron Laser. Applied Sciences, 10(19), 6947.
https://doi.org/10.3390/app10196947
