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Journal: Appl. Sci., 2020
Volume: 10
Number: 5268
5268
Article: Quantitative Investigation of Surface Charge Distribution and Point Probing Characteristics of Spherical Scattering Electrical Field Probe for Precision Measurement of Miniature Internal Structures with High Aspect Ratios
Authors: by Xingyuan Bian, Junning Cui, Yesheng Lu, Yamin Zhao, Zhongyi Cheng and Jiubin Tan
Link: https://www.mdpi.com/2076-3417/10/15/5268

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