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Journal: Appl. Sci., 2020
Volume: 10
Number: 3832

Article: Reliability-Enhanced Camera Lens Module Classification Using Semi-Supervised Regression Method
Authors: by Sung Wook Kim, Young Gon Lee, Bayu Adhi Tama and Seungchul Lee
Link: https://www.mdpi.com/2076-3417/10/11/3832

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