Article Versions Notes

Chou Y-J, Borisenko KB, Das PP, Nicolopoulos S, Gemmi M, Kirkland AI. Influence of Precession Electron Diffraction Parameters and Energy Filtering on Reduced Density Function Analysis of Thin Amorphous Silica Films—Implications for Structural Studies. Symmetry. 2023; 15(7):1291. https://doi.org/10.3390/sym15071291

Chou, Yu-Jen, Konstantin B. Borisenko, Partha Pratim Das, Stavros Nicolopoulos, Mauro Gemmi, and Angus I. Kirkland. 2023. "Influence of Precession Electron Diffraction Parameters and Energy Filtering on Reduced Density Function Analysis of Thin Amorphous Silica Films—Implications for Structural Studies" Symmetry 15, no. 7: 1291. https://doi.org/10.3390/sym15071291

Chou, Y.-J., Borisenko, K. B., Das, P. P., Nicolopoulos, S., Gemmi, M., & Kirkland, A. I. (2023). Influence of Precession Electron Diffraction Parameters and Energy Filtering on Reduced Density Function Analysis of Thin Amorphous Silica Films—Implications for Structural Studies. Symmetry, 15(7), 1291. https://doi.org/10.3390/sym15071291