Parametric Fault Diagnosis of Analog Circuits Based on a Semi-Supervised Algorithm
Abstract
:1. Introduction
2. Lifting Wavelet Transform
3. Local Fisher Discriminant Analysis (LFDA)
4. Semi-Supervised Random Forest Algorithm
5. Experimental Results and Discussion
5.1. Sallen–Key Band-Pass Filter Circuit
5.2. Three-Opamp Active Band-Stop Filter Circuit
6. Conclusions
Author Contributions
Funding
Conflicts of Interest
References
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Fault ID | Fault Mode | Nominal | Faulty Value and Variation Percentage |
---|---|---|---|
F0 | normal | --- | --- |
F1 | C1↑ | 5 nF | 5 nF (1 + 50%) 5 nF (1 + 100%) |
F2 | C1↓ | 5 nF | 5 nF (1 − 80%) 5 nF (1 − 50%) |
F3 | C2↑ | 5 nF | 5 nF (1 + 50%) 5 nF (1 + 100%) |
F4 | C2↓ | 5 nF | 5 nF (1 − 80%) 5 nF (1 − 50%) |
F5 | R2↑ | 3 kΩ | 3 kΩ (1 + 50%) 3 kΩ (1 + 100%) |
F6 | R2↓ | 3 kΩ | 3 kΩ (1 − 80%) 3 kΩ (1 − 50%) |
F7 | R3↑ | 2 kΩ | 2 kΩ (1 + 50%) 2 kΩ (1 + 100%) |
F8 | R3↓ | 2 kΩ | 2 kΩ (1 − 80%) 2 kΩ (1 − 50%) |
Fault ID | Fault Type | Nominal | Method 1 [9] | Method 2 [3] | Method 3 [17] | Proposed Method | ||||
---|---|---|---|---|---|---|---|---|---|---|
Fault Value | Accuracy | Fault Value | Accuracy | Fault Value | Accuracy | Fault Value | Accuracy | |||
F0 | normal | --- | --- | 97.2% | --- | 99% | --- | 100% | --- | 100% |
F1 | C1↑ | 5 nF | 7.5 nF | 99% | 10 nF | 100% | 7.5 nF | 95% | 7.5 nF 10 nF | 100% |
F2 | C1↓ | 5 nF | 2.5 nF | 100% | 2.5 nF | 100% | 2.5 nF | 100% | 1 nF 2.5 nF | 100% |
F3 | C2↑ | 5 nF | 7.5 nF | 96% | 10 nF | 100% | 7.5 nF | 90% | 7.5 nF 10 nF | 100% |
F4 | C2↓ | 5 nF | 2.5 nF | 97% | 2.5 nF | 100% | 2.5 nF | 100% | 1 nF 2.5 nF | 100% |
F5 | R2↑ | 3 kΩ | 4.5 kΩ | 98% | 6 kΩ | 99.3% | 4.5 kΩ | 100% | 4.5 kΩ 6 kΩ | 98% |
F6 | R2↓ | 3 kΩ | 1.5 kΩ | 100% | 1.5 kΩ | 99.3% | 1.5 kΩ | 100% | 0.6 kΩ 1.5 kΩ | 95% |
F7 | R3↑ | 2 kΩ | 3 kΩ | 100% | 4 kΩ | 100% | 3 kΩ | 95% | 3 kΩ 4 kΩ | 100% |
F8 | R3↓ | 2 kΩ | 1 kΩ | 98.6% | 1 kΩ | 100% | 1 kΩ | 100% | 0.4 kΩ 1 kΩ | 100% |
Fault ID | Fault Mode | Nominal | Faulty Value and Variation Percentage |
---|---|---|---|
F0 | --- | --- | --- |
F1 | C1↑C2↑ | 5 nF 5 nF | 5 nF (1 + 50%) 5 nF (1 + 100%) 5 nF (1 + 50%) 5 nF (1 + 100%) |
F2 | C1↓C2↓ | 5 nF 5 nF | 5 nF (1 − 80%) 5 nF (1 − 50%) 5 nF (1 − 80%) 5 nF (1 − 50%) |
F3 | R2↑R3↑ | 3 kΩ 2 kΩ | 3 kΩ (1 + 50%) 3 kΩ (1 + 100%) 2 kΩ (1 + 50%) 2 kΩ (1 + 100%) |
F4 | R2↓R3↓ | 3 kΩ 2 kΩ | 3 kΩ (1 − 80%) 3 kΩ (1 − 50%) 2 kΩ (1 − 80%) 2 kΩ (1 − 50%) |
F5 | R2↑C1↑ | 3 kΩ 5 nF | 3 kΩ (1 + 50%) 3 kΩ (1 + 100%) 5 nF (1 + 50%) 5 nF (1 + 100%) |
F6 | R2↑C2↓ | 3 kΩ 5 nF | 3 kΩ (1 + 50%) 3 kΩ (1 + 100%) 5 nF (1 − 80%) 5 nF (1 − 50%) |
F7 | R3↓C1↑ | 2 kΩ 5 nF | 2 kΩ (1 − 80%) 2 kΩ (1 − 50%) 5 nF (1 + 50%) 5 nF (1 + 100%) |
F8 | R3↓C2↓ | 2 kΩ 5nf | 2 kΩ (1 − 80%) 2 kΩ (1 − 50%) 5 nF (1 − 80%) 5 nF (1 − 50%) |
Fault ID | F0 | F1 | F2 | F3 | F4 | F5 | F6 | F7 | F8 |
---|---|---|---|---|---|---|---|---|---|
Accuracy | 100% | 100% | 100% | 100% | 96% | 100% | 100% | 98% | 94% |
Fault ID | Fault Mode | Nominal | Faulty Value and Variation Percentage |
---|---|---|---|
F0 | normal | --- | --- |
F1 | C4open | 10 nF | 100 MΩ |
F2 | R1↑ | 15 kΩ | 15 kΩ (1 + 20%) 15 kΩ (1 + 50%) |
F3 | R2↑ | 15 kΩ | 15 kΩ (1 + 20%) 15 kΩ (1 + 50%) |
F4 | C2↓ | 10 nF | 10 nF (1 − 50%) 10 nF (1 − 20%) |
F5 | C3↑ | 10 nF | 10 nF (1 + 50%) 10 nF (1 + 100%) |
F6 | R8↓ | 5.65 kΩ | 5.65 kΩ (1 − 80%) 5.65 kΩ (1 − 50%) |
F7 | R9↑ | 10 kΩ | 10 kΩ (1 + 50%) 10 kΩ (1 + 100%) |
F8 | R10↓ | 10 kΩ | 10 kΩ (1 − 80%) 10 kΩ (1 − 50%) |
F9 | R11↑ | 10 kΩ | 10 kΩ (1 + 50%) 10 kΩ (1 + 100%) |
F10 | R5↓ and R6↑ and C2↓ | 31 kΩ 31 kΩ 10 nF | 31 kΩ (1 − 50%) 31 kΩ (1 − 20%) 31 kΩ (1 + 20%) 31 kΩ (1 + 50%) 10 nF (1 − 50%) 10 nF (1 − 20%) |
F11 | R8↓ and R9↑ and C3↑ | 5.65 kΩ 10 kΩ 10 nF | 5.65 kΩ (1 − 50%) 5.65 kΩ (1 − 20%) 10 kΩ (1 + 20%) 10 kΩ (1 + 50%) 10 nF (1 + 20%) 10 nF (1 + 50%) |
F12 | R10↓ and R11↑ | 10 kΩ 10 kΩ | 10 kΩ (1 − 50%) 10 kΩ (1 − 20%) 10 kΩ (1 + 20%) 10 kΩ (1 + 50%) |
Fault ID | Fault Type | Nominal | Method1 [42] | Proposed Method |
---|---|---|---|---|
Fault Value | Fault Value | |||
F0 | normal | --- | --- | --- |
F1 | C4open | 10 nF | C4open | 100MΩ |
F2 | R1↑ | 15 kΩ | 15 kΩ (1 + 20%) | 15 kΩ (1 + 20%) 15 kΩ (1 + 50%) |
F3 | R2↑ | 15 kΩ | 15 kΩ (1 + 20%) | 15 kΩ (1 + 20%) 15 kΩ (1 + 50%) |
F4 | C2↓ | 10 nF | 10 nF (1 − 20%) | 10 nF (1 − 50%) 10 nF (1 − 20%) |
F5 | C3↑ | 10 nF | 10 nF (1 + 50%) | 10 nF (1 + 50%) 10 nF (1 + 100%) |
F6 | R8↓ | 5.65 kΩ | 5.65 kΩ (1-50%) | 5.65 kΩ (1 − 80%) 5.65 kΩ (1 − 50%) |
F7 | R9↑ | 10 kΩ | 10 kΩ (1 + 50%) | 10 kΩ (1 + 50%) 10 kΩ (1 + 100%) |
F8 | R10↓ | 10 kΩ | 10 kΩ (1-50%) | 10 kΩ (1 − 80%) 10 kΩ (1 − 50%) |
F9 | R11↑ | 10 kΩ | 10 kΩ (1 + 50%) | 10 kΩ (1 + 50%) 10 kΩ (1 + 100%) |
F10 | R5↓ and R6↑ and C2↓ | 31 kΩ 31 kΩ 10 nF | 31 kΩ (1 − 20%) 31 kΩ (1 + 20%) 10 nF (1 − 20%) | 31 kΩ (1 − 50%) 31 kΩ (1 − 20%) 31 kΩ (1 + 20%) 31 kΩ (1 + 50%) 10 nF (1 − 50%) 10 nF (1 − 20%) |
F11 | R8↓ and R9↑ and C3↑ | 5.65 kΩ 10 kΩ 10 nF | 5.65 kΩ (1 − 80%) 10 kΩ (1 + 20%) 10 nF (1 + 20%) | 5.65 kΩ (1 − 50%) 5.65 kΩ (1 − 20%) 10 kΩ (1 + 20%) 10 kΩ (1 + 50%) 10 nF (1 + 20%) 10 nF (1 + 50%) |
F12 | R10↓ and R11↑ | 10 kΩ 10 kΩ | 10 kΩ (1 − 20%) 10 kΩ (1 + 20%) | 10 kΩ (1 − 50%) 10 kΩ (1 − 20%) 10 kΩ (1 + 20%) 10 kΩ (1 + 50%) |
Average fault diagnosis | 93.08% | 98.2% |
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Wang, L.; Zhou, D.; Tian, H.; Zhang, H.; Zhang, W. Parametric Fault Diagnosis of Analog Circuits Based on a Semi-Supervised Algorithm. Symmetry 2019, 11, 228. https://doi.org/10.3390/sym11020228
Wang L, Zhou D, Tian H, Zhang H, Zhang W. Parametric Fault Diagnosis of Analog Circuits Based on a Semi-Supervised Algorithm. Symmetry. 2019; 11(2):228. https://doi.org/10.3390/sym11020228
Chicago/Turabian StyleWang, Ling, Dongfang Zhou, Hui Tian, Hao Zhang, and Wei Zhang. 2019. "Parametric Fault Diagnosis of Analog Circuits Based on a Semi-Supervised Algorithm" Symmetry 11, no. 2: 228. https://doi.org/10.3390/sym11020228