Chen, X.; Zhang, L.; Zhong, Q.; Zhang, G.; Yi, Y.; Wang, D.; Zhang, Q.
Applying Circuit Theory and Risk Assessment Models to Evaluate High-Temperature Risks for Vulnerable Groups and Identify Control Zones. Land 2025, 14, 1378.
https://doi.org/10.3390/land14071378
AMA Style
Chen X, Zhang L, Zhong Q, Zhang G, Yi Y, Wang D, Zhang Q.
Applying Circuit Theory and Risk Assessment Models to Evaluate High-Temperature Risks for Vulnerable Groups and Identify Control Zones. Land. 2025; 14(7):1378.
https://doi.org/10.3390/land14071378
Chicago/Turabian Style
Chen, Xuanying, Lang Zhang, Qicheng Zhong, Guilian Zhang, Yang Yi, Di Wang, and Qingping Zhang.
2025. "Applying Circuit Theory and Risk Assessment Models to Evaluate High-Temperature Risks for Vulnerable Groups and Identify Control Zones" Land 14, no. 7: 1378.
https://doi.org/10.3390/land14071378
APA Style
Chen, X., Zhang, L., Zhong, Q., Zhang, G., Yi, Y., Wang, D., & Zhang, Q.
(2025). Applying Circuit Theory and Risk Assessment Models to Evaluate High-Temperature Risks for Vulnerable Groups and Identify Control Zones. Land, 14(7), 1378.
https://doi.org/10.3390/land14071378
