Riaz, A.; KockAppelgren, P.; Hehir, J.G.; Kang, J.; Meade, F.; Cockram, J.; Milbourne, D.; Spink, J.; Mullins, E.; Byrne, S.
Genetic Analysis Using a Multi-Parent Wheat Population Identifies Novel Sources of Septoria Tritici Blotch Resistance. Genes 2020, 11, 887.
https://doi.org/10.3390/genes11080887
AMA Style
Riaz A, KockAppelgren P, Hehir JG, Kang J, Meade F, Cockram J, Milbourne D, Spink J, Mullins E, Byrne S.
Genetic Analysis Using a Multi-Parent Wheat Population Identifies Novel Sources of Septoria Tritici Blotch Resistance. Genes. 2020; 11(8):887.
https://doi.org/10.3390/genes11080887
Chicago/Turabian Style
Riaz, Adnan, Petra KockAppelgren, James Gerard Hehir, Jie Kang, Fergus Meade, James Cockram, Dan Milbourne, John Spink, Ewen Mullins, and Stephen Byrne.
2020. "Genetic Analysis Using a Multi-Parent Wheat Population Identifies Novel Sources of Septoria Tritici Blotch Resistance" Genes 11, no. 8: 887.
https://doi.org/10.3390/genes11080887
APA Style
Riaz, A., KockAppelgren, P., Hehir, J. G., Kang, J., Meade, F., Cockram, J., Milbourne, D., Spink, J., Mullins, E., & Byrne, S.
(2020). Genetic Analysis Using a Multi-Parent Wheat Population Identifies Novel Sources of Septoria Tritici Blotch Resistance. Genes, 11(8), 887.
https://doi.org/10.3390/genes11080887