Jin, H.; Zhang, J.; Dimtrov, Y.; Yang, X.; Du, R.; Wu, Y.; Chang, D.; Zhang, R.; Zhao, H.
Uncovering the Genetic Basis of Grain Yield-Related Traits in Common Vetch (Vicia sativa L.) Through Genome-Wide Association Mapping. Agronomy 2025, 15, 2128.
https://doi.org/10.3390/agronomy15092128
AMA Style
Jin H, Zhang J, Dimtrov Y, Yang X, Du R, Wu Y, Chang D, Zhang R, Zhao H.
Uncovering the Genetic Basis of Grain Yield-Related Traits in Common Vetch (Vicia sativa L.) Through Genome-Wide Association Mapping. Agronomy. 2025; 15(9):2128.
https://doi.org/10.3390/agronomy15092128
Chicago/Turabian Style
Jin, Hui, Jumei Zhang, Yordan Dimtrov, Xue Yang, Ruonan Du, Yu’e Wu, Danna Chang, Rui Zhang, and Haibin Zhao.
2025. "Uncovering the Genetic Basis of Grain Yield-Related Traits in Common Vetch (Vicia sativa L.) Through Genome-Wide Association Mapping" Agronomy 15, no. 9: 2128.
https://doi.org/10.3390/agronomy15092128
APA Style
Jin, H., Zhang, J., Dimtrov, Y., Yang, X., Du, R., Wu, Y., Chang, D., Zhang, R., & Zhao, H.
(2025). Uncovering the Genetic Basis of Grain Yield-Related Traits in Common Vetch (Vicia sativa L.) Through Genome-Wide Association Mapping. Agronomy, 15(9), 2128.
https://doi.org/10.3390/agronomy15092128