Obua, T.; Sserumaga, J.P.; Tukamuhabwa, P.; Namara, M.; Awio, B.; Mugarra, J.; Tusiime, G.; Chigeza, G.
Unravelling Yield and Yield-Related Traits in Soybean Using GGE Biplot and Path Analysis. Agronomy 2024, 14, 2826.
https://doi.org/10.3390/agronomy14122826
AMA Style
Obua T, Sserumaga JP, Tukamuhabwa P, Namara M, Awio B, Mugarra J, Tusiime G, Chigeza G.
Unravelling Yield and Yield-Related Traits in Soybean Using GGE Biplot and Path Analysis. Agronomy. 2024; 14(12):2826.
https://doi.org/10.3390/agronomy14122826
Chicago/Turabian Style
Obua, Tonny, Julius Pyton Sserumaga, Phinehas Tukamuhabwa, Mercy Namara, Bruno Awio, Johnson Mugarra, Geoffrey Tusiime, and Godfree Chigeza.
2024. "Unravelling Yield and Yield-Related Traits in Soybean Using GGE Biplot and Path Analysis" Agronomy 14, no. 12: 2826.
https://doi.org/10.3390/agronomy14122826
APA Style
Obua, T., Sserumaga, J. P., Tukamuhabwa, P., Namara, M., Awio, B., Mugarra, J., Tusiime, G., & Chigeza, G.
(2024). Unravelling Yield and Yield-Related Traits in Soybean Using GGE Biplot and Path Analysis. Agronomy, 14(12), 2826.
https://doi.org/10.3390/agronomy14122826