Tian, Y.; Liu, P.; Cui, F.; Xu, H.; Han, X.; Nie, Y.; Kong, D.; Sang, W.; Li, W.
Genome-Wide Association Study for Yield and Yield-Related Traits in Chinese Spring Wheat. Agronomy 2023, 13, 2784.
https://doi.org/10.3390/agronomy13112784
AMA Style
Tian Y, Liu P, Cui F, Xu H, Han X, Nie Y, Kong D, Sang W, Li W.
Genome-Wide Association Study for Yield and Yield-Related Traits in Chinese Spring Wheat. Agronomy. 2023; 13(11):2784.
https://doi.org/10.3390/agronomy13112784
Chicago/Turabian Style
Tian, Yousheng, Pengpeng Liu, Fengjuan Cui, Hongjun Xu, Xinnian Han, Yingbin Nie, Dezhen Kong, Wei Sang, and Weihua Li.
2023. "Genome-Wide Association Study for Yield and Yield-Related Traits in Chinese Spring Wheat" Agronomy 13, no. 11: 2784.
https://doi.org/10.3390/agronomy13112784
APA Style
Tian, Y., Liu, P., Cui, F., Xu, H., Han, X., Nie, Y., Kong, D., Sang, W., & Li, W.
(2023). Genome-Wide Association Study for Yield and Yield-Related Traits in Chinese Spring Wheat. Agronomy, 13(11), 2784.
https://doi.org/10.3390/agronomy13112784