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Journal: Crystals, 2017
Volume: 7
Number: 356
Article:
Structural Characterization of Perpendicularly Aligned Submicrometer-Thick Synthetic Glycolipid Polycrystalline Films Using Conventional X-ray Diffraction
Authors:
by
Shigesaburo Ogawa and Isao Takahashi
Link:
https://www.mdpi.com/2073-4352/7/12/356
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