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Journal: Crystals, 2025
Volume: 15
Number: 854
854
Article: X-Ray Crystallography, Hirshfeld Surface Analysis, and Molecular Docking Studies of Two Sulfonamide Derivatives
Authors: by José Luis Madrigal-Angulo, Nancy E. Magaña-Vergara, Juan Saulo González-González, José Martín Santiago-Quintana, Efrén V. García-Báez, Itzia I. Padilla-Martínez and Francisco J. Martínez-Martínez
Link: https://www.mdpi.com/2073-4352/15/10/854

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