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Journal: Crystals, 2023
Volume: 13
Number: 628

Article: The Impact of Hysteresis Effect on Device Characteristic and Reliability for Various Fin-Widths Tri-Gate Hf0.5Zr0.5O2 Ferroelectric FinFET
Authors: by Wen-Qi Zhang, Po-Tang Wu, Yu-Heng Lin and Yi-Lin Yang
Link: https://www.mdpi.com/2073-4352/13/4/628

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