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Journal: Crystals, 2023
Volume: 13
Number: 314
314
Article: Towards Extended Gate Field Effect Transistor-Based Radiation Sensors: Impact of Thicknesses and Radiation Doses on Al-Doped Zinc Oxide Sensitivity
Authors: by Amal Mohamed Ahmed Ali, Naser M. Ahmed, Norlaili A. Kabir, Natheer A. Algadri, Ahmad M. AL-Diabat, I. A. Wadi, Ahmed Alsadig, Osamah A. Aldaghri and Khalid H. Ibnaouf
Link: https://www.mdpi.com/2073-4352/13/2/314

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