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Journal: Crystals, 2023
Volume: 13
Number: 1462

Article: Residual Stress Testing and Simulation Analysis of Crystal Structures of Electronic Device Materials
Authors: by Ming Chen, Jiasheng Li, Wei Su, Zhenhua Nie, Butian Zhong and Xianshan Dong
Link: https://www.mdpi.com/2073-4352/13/10/1462

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