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        Journal: Crystals, 2023
        Volume: 13 
                	Number: 1462 
                
        
        Article:
        Residual Stress Testing and Simulation Analysis of Crystal Structures of Electronic Device Materials 
        Authors: 
       	by
                    Ming Chen, Jiasheng Li, Wei Su, Zhenhua Nie, Butian Zhong and Xianshan Dong        
        Link:
        https://www.mdpi.com/2073-4352/13/10/1462
        
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