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Journal: Crystals, 2022
Volume: 12
Number: 1195
1195
Article: Effect of Source Field Plate Cracks on the Electrical Performance of AlGaN/GaN HEMT Devices
Authors: by Ye-Nan Bie, Cheng-Lin Du, Xiao-Long Cai, Ran Ye, Hai-Jun Liu, Yu Zhang, Xiang-Yang Duan and Jie-Jie Zhu
Link: https://www.mdpi.com/2073-4352/12/9/1195

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