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Journal: Crystals, 2022
Volume: 12
Number: 765
765
Article: Processes of the Reliability and Degradation Mechanism of High-Power Semiconductor Lasers
Authors: by Yue Song, Zhiyong Lv, Jiaming Bai, Shen Niu, Zibo Wu, Li Qin, Yongyi Chen, Lei Liang, Yuxin Lei, Peng Jia, Xiaonan Shan and Lijun Wang
Link: https://www.mdpi.com/2073-4352/12/6/765

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