Nguyen, X.A.; Nguyen, T.M.H.; Kim, T.J.; Le, L.V.; Nguyen, T.H.; Kim, B.; Kim, K.; Lee, W.; Cho, S.; Kim, Y.D.
A Systematic Study of Compositionally Dependent Dielectric Tensors of SnSxSe1-x Alloys by Spectroscopic Ellipsometry. Crystals 2021, 11, 548.
https://doi.org/10.3390/cryst11050548
AMA Style
Nguyen XA, Nguyen TMH, Kim TJ, Le LV, Nguyen TH, Kim B, Kim K, Lee W, Cho S, Kim YD.
A Systematic Study of Compositionally Dependent Dielectric Tensors of SnSxSe1-x Alloys by Spectroscopic Ellipsometry. Crystals. 2021; 11(5):548.
https://doi.org/10.3390/cryst11050548
Chicago/Turabian Style
Nguyen, Xuan Au, Thi Minh Hai Nguyen, Tae Jung Kim, Long Van Le, Tung Hoang Nguyen, Bogyu Kim, Kyujin Kim, Wonjun Lee, Sunglae Cho, and Young Dong Kim.
2021. "A Systematic Study of Compositionally Dependent Dielectric Tensors of SnSxSe1-x Alloys by Spectroscopic Ellipsometry" Crystals 11, no. 5: 548.
https://doi.org/10.3390/cryst11050548
APA Style
Nguyen, X. A., Nguyen, T. M. H., Kim, T. J., Le, L. V., Nguyen, T. H., Kim, B., Kim, K., Lee, W., Cho, S., & Kim, Y. D.
(2021). A Systematic Study of Compositionally Dependent Dielectric Tensors of SnSxSe1-x Alloys by Spectroscopic Ellipsometry. Crystals, 11(5), 548.
https://doi.org/10.3390/cryst11050548
