Order Article Reprints

Coppola N, Polverino P, Carapella G, Sacco C, Galdi A, Ubaldini A, Vaiano V, Montinaro D, Maritato L, Pianese C. Structural and Electrical Characterization of Sputter-Deposited Gd_0.1Ce_0.9O_2−δ Thin Buffer Layers at the Y-Stabilized Zirconia Electrolyte Interface for IT-Solid Oxide Cells. Catalysts. 2018; 8(12):571. https://doi.org/10.3390/catal8120571

Coppola, Nunzia, Pierpaolo Polverino, Giovanni Carapella, Chiara Sacco, Alice Galdi, Alberto Ubaldini, Vincenzo Vaiano, Dario Montinaro, Luigi Maritato, and Cesare Pianese. 2018. "Structural and Electrical Characterization of Sputter-Deposited Gd_0.1Ce_0.9O_2−δ Thin Buffer Layers at the Y-Stabilized Zirconia Electrolyte Interface for IT-Solid Oxide Cells" Catalysts 8, no. 12: 571. https://doi.org/10.3390/catal8120571

Coppola, N., Polverino, P., Carapella, G., Sacco, C., Galdi, A., Ubaldini, A., Vaiano, V., Montinaro, D., Maritato, L., & Pianese, C. (2018). Structural and Electrical Characterization of Sputter-Deposited Gd_0.1Ce_0.9O_2−δ Thin Buffer Layers at the Y-Stabilized Zirconia Electrolyte Interface for IT-Solid Oxide Cells. Catalysts, 8(12), 571. https://doi.org/10.3390/catal8120571