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Journal: Micromachines, 2018
Volume: 9
Number: 603

Article: Influence of Passivation Layers on Positive Gate Bias-Stress Stability of Amorphous InGaZnO Thin-Film Transistors
Authors: by Yan Zhou and Chengyuan Dong
Link: https://www.mdpi.com/2072-666X/9/11/603

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