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Journal: Micromachines, 2018
Volume: 9
Number: 603
Article:
Influence of Passivation Layers on Positive Gate Bias-Stress Stability of Amorphous InGaZnO Thin-Film Transistors
Authors:
by
Yan Zhou and Chengyuan Dong
Link:
https://www.mdpi.com/2072-666X/9/11/603
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