Analysis of the Dynamic Characteristics of a Micro-Piezoelectric Bimorph Beam Based on an Admittance Test
Abstract
:1. Introduction
2. Analysis of the Equivalent Circuit and Principle of a Piezoelectric Bimorph Beam
3. Methods for the Admittance Test of a Piezoelectric Bimorph Beam
4. Experiment Result and Discussion of the Admittance Test
5. Results
Acknowledgments
Author Contributions
Conflicts of Interest
References
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Zheng, T.; Chen, S.; Lei, L.; Deng, Z.; Zhang, C.; Yang, X.; Zou, H.; Xu, M. Analysis of the Dynamic Characteristics of a Micro-Piezoelectric Bimorph Beam Based on an Admittance Test. Micromachines 2017, 8, 220. https://doi.org/10.3390/mi8070220
Zheng T, Chen S, Lei L, Deng Z, Zhang C, Yang X, Zou H, Xu M. Analysis of the Dynamic Characteristics of a Micro-Piezoelectric Bimorph Beam Based on an Admittance Test. Micromachines. 2017; 8(7):220. https://doi.org/10.3390/mi8070220
Chicago/Turabian StyleZheng, Tianxiang, Shuo Chen, Linxu Lei, Zhanfeng Deng, Cheng Zhang, Xing Yang, Haodong Zou, and Menghan Xu. 2017. "Analysis of the Dynamic Characteristics of a Micro-Piezoelectric Bimorph Beam Based on an Admittance Test" Micromachines 8, no. 7: 220. https://doi.org/10.3390/mi8070220
APA StyleZheng, T., Chen, S., Lei, L., Deng, Z., Zhang, C., Yang, X., Zou, H., & Xu, M. (2017). Analysis of the Dynamic Characteristics of a Micro-Piezoelectric Bimorph Beam Based on an Admittance Test. Micromachines, 8(7), 220. https://doi.org/10.3390/mi8070220