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Journal: Micromachines, 2017
Volume: 8
Number: 31
31
Article: MEMS Device for Quantitative In Situ Mechanical Testing in Electron Microscope
Authors: by Xiaodong Wang, Shengcheng Mao, Jianfei Zhang, Zhipeng Li, Qingsong Deng, Jin Ning, Xudong Yang, Li Wang, Yuan Ji, Xiaochen Li, Yinong Liu, Ze Zhang and Xiaodong Han
Link: https://www.mdpi.com/2072-666X/8/2/31

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