A Nonlinear MEMS Inertial Switch Fabricated by Induction-Electrode Through-Mask Electrochemical Micromachining
Abstract
1. Introduction
2. Operating Principle and Structural Design of the Nonlinear Inertial Switch
2.1. Operating Principle
2.2. Structural Design
3. Simulation
3.1. Static Simulation Analysis
3.2. Dynamic Simulation Analysis
4. Fabrication and Testing
4.1. Fabrication
4.2. Testing
5. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Acknowledgments
Conflicts of Interest
Abbreviations
| MEMS | Microelectromechanical systems |
| IETMEMM | Induction-electrode through-mask electrochemical micromachining |
| TMEMM | Through-mask electrochemical micromachining |
| PCB | Printed circuit board |
| ARS | Acceleration response signal |
| SCS | Switch closure signal |
References
- Cao, Y.; Xi, Z. A review of MEMS inertial switches. Microsyst. Technol. 2019, 25, 4405–4425. [Google Scholar] [CrossRef] [Scilit]
- Liu, M.; Wu, X.; Niu, Y.; Yang, H.; Zhu, Y.; Wang, W. Research progress of MEMS inertial switches. Micromachines 2022, 13, 359. [Google Scholar] [CrossRef] [Scilit]
- Matsunaga, T.; Esashi, M. Acceleration switch with extended holding time using squeeze film effect for side airbag systems. Sens. Actuators A Phys. 2002, 100, 10–17. [Google Scholar] [CrossRef] [Scilit]
- Michaelis, S.; Timme, H.-J.; Wycisk, M.; Binder, J. Additive electroplating technology as a post-CMOS process for the production of MEMS acceleration-threshold switches for transportation applications. J. Micromech. Microeng. 2000, 10, 120–123. [Google Scholar] [CrossRef] [Scilit]
- Ibrahim, A.; Younis, M.I. Simple fall criteria for MEMS sensors: Data analysis and sensor concept. Sensors 2014, 14, 12149–12173. [Google Scholar] [CrossRef] [Scilit]
- Srisiri, W.; Le, N.T.; Saleem, M.A.; Kaewplung, P.; Chaitusaney, S.; Benjapolakul, W. Artificial intelligence-based fault classification on photovoltaic plants using a low-cost open-source IoT system. Sci. Rep. 2026, 16, 1110. [Google Scholar] [CrossRef] [Scilit]
- Fathalilou, M.; Soltani, K.; Rezazadeh, G.; Cigeroglu, E. Enhancement of the reliability of MEMS shock sensors by adopting a dual-mass model. Measurement 2020, 153, 107428. [Google Scholar] [CrossRef] [Scilit]
- Xu, Q.; Yang, Z.; Fu, B.; Li, J.; Wu, H.; Zhang, Q.; Sun, Y.; Ding, G.; Zhao, X. A surface-micromachining-based inertial micro-switch with compliant cantilever beam as movable electrode for enduring high shock and prolonging contact time. Appl. Surf. Sci. 2016, 387, 569–580. [Google Scholar] [CrossRef] [Scilit]
- Zhang, F.; Yuan, M.; Jin, W.; Xiong, Z. Fabrication of a silicon based vertical sensitive low-g inertial micro-switch for linear acceleration sensing. Microsyst. Technol. 2017, 23, 2467–2473. [Google Scholar] [CrossRef] [Scilit]
- Peng, Y.; Wu, G.; Pan, C.; Lv, C.; Luo, T. A 5 g inertial micro-switch with enhanced threshold accuracy using squeeze-film damping. Micromachines 2018, 9, 539. [Google Scholar] [CrossRef] [Scilit]
- DelRio, F.W.; Cook, R.F.; Boyce, B.L. Fracture strength of micro- and nano-scale silicon components. Appl. Phys. Rev. 2015, 2, 021303. [Google Scholar] [CrossRef] [Scilit]
- Du, L.; Li, Y.; Zhao, J.; Wang, W.; Zhao, W.; Zhao, W.; Zhu, H. A low-g MEMS inertial switch with a novel radial electrode for uniform omnidirectional sensitivity. Sens. Actuators A Phys. 2018, 270, 214–222. [Google Scholar] [CrossRef] [Scilit]
- Du, L.; Zhao, M.; Wang, A.; Chen, S.; Nie, W. Fabrication of novel MEMS inertial switch with six layers on a metal substrate. Microsyst. Technol. 2015, 21, 2025–2032. [Google Scholar] [CrossRef] [Scilit]
- Tran, H.V.; Ngo, T.H.; Tran, N.D.K.; Dang, T.N.; Dao, T.-P.; Wang, D.-A. A threshold accelerometer based on a tristable mechanism. Mechatronics 2018, 53, 39–55. [Google Scholar] [CrossRef] [Scilit]
- Zhao, J.; Jia, J.; Wang, H.; Li, W. A novel threshold accelerometer with postbuckling structures for airbag restraint systems. IEEE Sens. J. 2007, 7, 1102–1109. [Google Scholar] [CrossRef] [Scilit]
- Xu, Q.; Younis, M.I. Micromachined threshold inertial switches: A review. J. Micromech. Microeng. 2022, 32, 063001. [Google Scholar] [CrossRef] [Scilit]
- Cai, H.; Yang, Z.; Ding, G.; Wang, H. Development of a novel MEMS inertial switch with a compliant stationary electrode. IEEE Sens. J. 2009, 9, 801–808. [Google Scholar] [CrossRef] [Scilit]
- Currano, L.J.; Becker, C.R.; Lunking, D.; Smith, G.L.; Isaacson, B.; Thomas, L. Triaxial inertial switch with multiple thresholds and resistive ladder readout. Sens. Actuators A Phys. 2013, 195, 191–197. [Google Scholar] [CrossRef] [Scilit]
- Ding, B.; Li, X.; Li, Y. Configuration design and experimental verification of a variable constant-force compliant mechanism. Robotica 2022, 40, 3463–3475. [Google Scholar] [CrossRef] [Scilit]
- Xi, Z.; Zhang, P.; Nie, W.; Du, L.; Cao, Y. A novel MEMS omnidirectional inertial switch with flexible electrodes. Sens. Actuators A Phys. 2014, 212, 93–101. [Google Scholar] [CrossRef] [Scilit]
- Chen, W.; Wang, R.; Wang, H.; Kong, D.; Sun, S. The analysis of the influence of threshold on the dynamic contact process of a fabricated vertically driven MEMS inertial switch. Micromachines 2019, 10, 791. [Google Scholar] [CrossRef] [Scilit]
- Jeon, G.J.; Oh, J.H. Chevron-beam-based nonlinearity-tunable elastic metamaterial. Phys. Rev. E 2023, 107, 044208. [Google Scholar] [CrossRef] [Scilit]
- Yang, X.; Du, L.; Li, A.; Wu, M.; Wu, C.; Li, J. A novel method of induction electrode through-mask electrochemical micromachining. Int. J. Mach. Tools Manuf. 2024, 203, 104221. [Google Scholar] [CrossRef] [Scilit]
- Yang, X.; Li, M.; Shang, B.; Qiu, H.; Liu, B.; Du, L. Overcoming electric field non-uniformity in through-mask electrochemical micromachining using regulating electrode. J. Mater. Process. Technol. 2026, 350, 119259. [Google Scholar] [CrossRef] [Scilit]
















| Component | Geometric Parameter | Value |
|---|---|---|
| Nonlinear spring | S1 | 9000 μm |
| φ1 | 1.001° | |
| φ2 | 1.146° | |
| W1 | 120 μm | |
| Linear spring | S2 | 9130 μm |
| h1 | 400 μm | |
| h2 | 500 μm | |
| Fixed electrode | X | 180 μm |
| W2 | 150 μm | |
| φ3 | 45° | |
| Proof mass | D1 | 10,050 μm |
| H1 | 11,750 μm | |
| Frame | D2 | 24,110 μm |
| H2 | 17,590 μm |
| Pulse Width (ms) | Nonlinear-Switch Threshold (g) | Linear-Switch Threshold (g) |
|---|---|---|
| 4 | 29.5 | 17.2 |
| 6 | 29.5 | 17.4 |
| 8 | 28.4 | 20.2 |
| 10 | 26.9 | 24.3 |
| 14 | 26.8 | 24.4 |
| Static | 27.5 | 27.5 |
| Device Structure | Geometric Parameter | Measured Value (μm) |
| Nonlinear inertial switch | W1 | 118 |
| W2 | 152 | |
| X1 | 177 | |
| Linear inertial switch | W3 | 117 |
| W4 | 151 | |
| X2 | 178 |
| Testing and Statistics | 4 ms | 6 ms | 8 ms | 10 ms | 14 ms |
|---|---|---|---|---|---|
| Device 1, Test 1 | 28.3 (1) | 26.8 (0) | 25.7 (0) | 26.3 (1) | 24.9 (0) |
| Device 1, Test 2 | 27.1 (0) | 26.6 (0) | 27.7 (1) | 25.1 (0) | 24.5 (0) |
| Device 1, Test 3 | 28.3 (1) | 28.4 (1) | 26.5 (0) | 25.9 (1) | 25.7 (1) |
| Device 1, Test 4 | 27.3 (0) | 26.9 (0) | 26.4 (0) | 24.3 (0) | 24.6 (0) |
| Device 1, Test 5 | 28.9 (1) | 27.1 (0) | 27.6 (1) | 25.0 (0) | 25.5 (1) |
| Device 1, Test 6 | 28.5 (1) | 28.2 (1) | 27.4 (1) | 24.8 (0) | 26.0 (1) |
| Device 2, Test 1 | 27.5 (0) | 28.4 (1) | 27.4 (1) | 24.7 (0) | 25.7 (1) |
| Device 2, Test 2 | 28.6 (1) | 29.0 (1) | 27.3 (1) | 24.3 (0) | 24.5 (0) |
| Device 2, Test 3 | 26.6 (0) | 28.9 (1) | 26.1 (0) | 26.1 (1) | 24.2 (0) |
| Device 2, Test 4 | 26.9 (0) | 27.1 (0) | 26.4 (0) | 25.7 (1) | 25.7 (1) |
| Device 2, Test 5 | 26.9 (0) | 27.4 (0) | 28.1 (1) | 26.1 (1) | 25.7 (1) |
| Device 2, Test 6 | 28.1 (1) | 28.8 (1) | 26.4 (0) | 26.4 (1) | 24.6 (0) |
| Overall Mean (n = 12) | 27.750 | 27.800 | 26.917 | 25.392 | 25.133 |
| Standard Deviation (SD) | 0.786 | 0.901 | 0.752 | 0.777 | 0.637 |
| 95% CI, Lower Bound | 27.251 | 27.228 | 26.439 | 24.898 | 24.728 |
| 95% CI, Upper Bound | 28.249 | 28.372 | 27.394 | 25.886 | 25.538 |
| Device 1 Mean | 28.067 | 27.333 | 26.883 | 25.233 | 25.200 |
| Device 2 Mean | 27.433 | 28.267 | 26.950 | 25.550 | 25.067 |
| Absolute Inter-Device Mean Difference (|D1 – D2|) | 0.633 | 0.933 | 0.067 | 0.317 | 0.133 |
| Testing and Statistics | 4 ms | 6 ms | 8 ms | 10 ms | 14 ms |
|---|---|---|---|---|---|
| Device 1, Test 1 | 14.4 (0) | 14.6 (0) | 17.1 (0) | 21.2 (0) | 20.8 (0) |
| Device 1, Test 2 | 14.2 (0) | 16.1 (1) | 19.2 (1) | 22.2 (1) | 22.4 (1) |
| Device 1, Test 3 | 16.1 (1) | 16.0 (1) | 17.5 (0) | 20.3 (0) | 22.5 (1) |
| Device 1, Test 4 | 15.0 (0) | 14.5 (0) | 19.1 (1) | 22.7 (1) | 22.6 (1) |
| Device 1, Test 5 | 15.8 (1) | 16.6 (1) | 17.3 (0) | 21.0 (0) | 20.8 (0) |
| Device 1, Test 6 | 14.2 (0) | 14.4 (0) | 18.5 (1) | 20.7 (0) | 23.0 (1) |
| Device 2, Test 1 | 16.3 (1) | 14.9 (0) | 18.7 (1) | 21.0 (0) | 22.3 (1) |
| Device 2, Test 2 | 16.0 (1) | 15.8 (1) | 19.1 (1) | 20.3 (0) | 20.9 (0) |
| Device 2, Test 3 | 14.6 (0) | 15.2 (0) | 17.2 (0) | 22.5 (1) | 22.6 (1) |
| Device 2, Test 4 | 15.9 (1) | 15.9 (1) | 19.1 (1) | 22.1 (1) | 21.2 (0) |
| Device 2, Test 5 | 14.3 (0) | 16.5 (1) | 16.7 (0) | 22.0 (1) | 21.3 (0) |
| Device 2, Test 6 | 16.1 (1) | 14.6 (0) | 16.9 (0) | 22.2 (1) | 21.5 (0) |
| Overall Mean (n = 12) | 15.242 | 15.425 | 18.033 | 21.517 | 21.825 |
| Standard Deviation (SD) | 0.861 | 0.814 | 0.995 | 0.860 | 0.816 |
| 95% CI, Lower Bound | 14.695 | 14.908 | 17.401 | 20.970 | 21.307 |
| 95% CI, Upper Bound | 15.789 | 15.942 | 18.665 | 22.063 | 22.343 |
| Device 1 Mean | 14.950 | 15.367 | 18.117 | 21.350 | 22.017 |
| Device 2 Mean | 15.533 | 15.483 | 17.950 | 21.683 | 21.633 |
| Absolute Inter-Device Mean Difference (|D1 – D2|) | 0.583 | 0.117 | 0.167 | 0.333 | 0.383 |
Disclaimer/Publisher’s Note: The statements, opinions and data contained in all publications are solely those of the individual author(s) and contributor(s) and not of MDPI and/or the editor(s). MDPI and/or the editor(s) disclaim responsibility for any injury to people or property resulting from any ideas, methods, instructions or products referred to in the content. |
© 2026 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license.
Share and Cite
Shang, B.; Li, M.; Yang, X.; Liu, B.; Qiu, H.; Cui, Y.; Du, L. A Nonlinear MEMS Inertial Switch Fabricated by Induction-Electrode Through-Mask Electrochemical Micromachining. Micromachines 2026, 17, 1007. https://doi.org/10.3390/mi17091007
Shang B, Li M, Yang X, Liu B, Qiu H, Cui Y, Du L. A Nonlinear MEMS Inertial Switch Fabricated by Induction-Electrode Through-Mask Electrochemical Micromachining. Micromachines. 2026; 17(9):1007. https://doi.org/10.3390/mi17091007
Chicago/Turabian StyleShang, Bingze, Meng Li, Xiaochen Yang, Bingnan Liu, Huifeng Qiu, Yan Cui, and Liqun Du. 2026. "A Nonlinear MEMS Inertial Switch Fabricated by Induction-Electrode Through-Mask Electrochemical Micromachining" Micromachines 17, no. 9: 1007. https://doi.org/10.3390/mi17091007
APA StyleShang, B., Li, M., Yang, X., Liu, B., Qiu, H., Cui, Y., & Du, L. (2026). A Nonlinear MEMS Inertial Switch Fabricated by Induction-Electrode Through-Mask Electrochemical Micromachining. Micromachines, 17(9), 1007. https://doi.org/10.3390/mi17091007

