Li, Y.; Tian, S.; Sun, W.; Chen, L.; Li, J.; Hu, J.; Meng, N.
FMW-YOLO: A Frequency-Enhanced and Multi-Scale Context-Aware Framework for PCB Defect Detection. Micromachines 2026, 17, 531.
https://doi.org/10.3390/mi17050531
AMA Style
Li Y, Tian S, Sun W, Chen L, Li J, Hu J, Meng N.
FMW-YOLO: A Frequency-Enhanced and Multi-Scale Context-Aware Framework for PCB Defect Detection. Micromachines. 2026; 17(5):531.
https://doi.org/10.3390/mi17050531
Chicago/Turabian Style
Li, Yuguo, Shuo Tian, Wenzheng Sun, Longfa Chen, Jian Li, Junkai Hu, and Na Meng.
2026. "FMW-YOLO: A Frequency-Enhanced and Multi-Scale Context-Aware Framework for PCB Defect Detection" Micromachines 17, no. 5: 531.
https://doi.org/10.3390/mi17050531
APA Style
Li, Y., Tian, S., Sun, W., Chen, L., Li, J., Hu, J., & Meng, N.
(2026). FMW-YOLO: A Frequency-Enhanced and Multi-Scale Context-Aware Framework for PCB Defect Detection. Micromachines, 17(5), 531.
https://doi.org/10.3390/mi17050531