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Journal: Micromachines, 2026
Volume: 17
Number: 197

Article: Radiation-Induced Degradation of a Cold-Redundant DC/DC Converter Under Total Ionizing Dose Stress
Authors: by Xiaojin Lu, Zhujun Xi, Qifeng He, Ziyu Zhou, Mengyao Li, Liangyu Xia and Gang Dong
Link: https://www.mdpi.com/2072-666X/17/2/197

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