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Journal: Micromachines, 2025
Volume: 16
Number: 729
729
Article: Damage Mechanism Analysis of High Field Stress on Cascode GaN HEMT Power Devices
Authors: by Shuo Su, Yanrong Cao, Weiwei Zhang, Xinxiang Zhang, Chuan Chen, Linshan Wu, Zhixian Zhang, Miaofen Li, Ling Lv, Xuefeng Zheng, Wenchao Tian, Xiaohua Ma and Yue Hao
Link: https://www.mdpi.com/2072-666X/16/7/729

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