Article Versions Notes

Su S, Cao Y, Zhang W, Zhang X, Chen C, Wu L, Zhang Z, Li M, Lv L, Zheng X, et al. Damage Mechanism Analysis of High Field Stress on Cascode GaN HEMT Power Devices. Micromachines. 2025; 16(7):729. https://doi.org/10.3390/mi16070729

Su, Shuo, Yanrong Cao, Weiwei Zhang, Xinxiang Zhang, Chuan Chen, Linshan Wu, Zhixian Zhang, Miaofen Li, Ling Lv, Xuefeng Zheng, and et al. 2025. "Damage Mechanism Analysis of High Field Stress on Cascode GaN HEMT Power Devices" Micromachines 16, no. 7: 729. https://doi.org/10.3390/mi16070729

Su, S., Cao, Y., Zhang, W., Zhang, X., Chen, C., Wu, L., Zhang, Z., Li, M., Lv, L., Zheng, X., Tian, W., Ma, X., & Hao, Y. (2025). Damage Mechanism Analysis of High Field Stress on Cascode GaN HEMT Power Devices. Micromachines, 16(7), 729. https://doi.org/10.3390/mi16070729