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Journal: Micromachines, 2025
Volume: 16
Number: 458
Article:
Investigation on Electromigration-Induced Failure and Reservoir Effect in AlCu Interconnects
Authors:
by
Yuanxiang Zhang, Guoquan Jiang, Jingbo Zhao and Lihua Liang
Link:
https://www.mdpi.com/2072-666X/16/4/458
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