Order Article Reprints
Journal: MicromachinesVolume: 16Number: 371
Article: Analyzing the Impact of Gate Oxide Screening on Interface Trap Density in SiC Power MOSFETs Using a Novel Temperature-Triggered Method
- Authors:
- Monikuntala Bhattacharya1,*,
- Michael Jin1 and
- Hengyu Yu1
- et al.
MDPI offers high quality article reprints with convenient shipping to destinations worldwide. Each reprint features a 270 gsm bright white cover and 105 gsm premium white paper, bound with two stitches for durability and printed in full color. The cover design is customized to your article and designed to be complimentary to the journal.